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Mx 進階影片分析授權

Mx 進階影片分析授權 - Main image
$6480 $9000 In stock

Category: Mx 軟體

  • 說明

Mx 適用的進階模型式薄膜分析授權。可量測透明光學薄膜的厚度與表面形貌,範圍大於 50 奈米。此授權亦包含厚膜軟體授權。MBA 需要 Nexview 等級的光學輪廓儀進行資料擷取。

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Customer Reviews (5.0 / 5 · 5 reviews)

Matthew I. ★★★★★

I was skeptical about the topography feature at first, but it's incredibly precise for checking uniformity across my samples. The license unlocked everything I needed for optical film analysis without any extra hassle.

Matthew G. ★★★★★

The thickness mapping for films above 50nm is spot-on—I ran a few samples and the topography results matched our reference measurements within a couple nanometers. It’s pricey, but for anyone doing optical film QC, this license pays for itself fast.

Richard ★★★★★

Setup took a bit of fiddling, but once I got the license key entered, the thickness mapping on our sub-100nm films came through crystal clear. The topographical data lines up with our reference samples almost perfectly, which is a huge relief for QC.