薄膜軟體授權

Finally got the license activated for our thin-film work, and the thickness measurement above 1 um is spot-on every time. The topography mode for films over 400 nm has been a real time-saver in our lab. Setup was a bit fiddly, but once it clicked, it’s been rock solid.

I've been using this license to measure film thickness on some samples over 1 um, and the topography results are impressively clean. It handles my routine checks without any hiccups or weird artifacts in the data.

I was a bit worried about compatibility, but the license activated smoothly and the film thickness measurements down to 400 nm for topography are dead-on accurate. The >1 um thickness mapping is also quick, even on our multilayer samples.