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Advanced Films Analysis License for Mx

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$6480 $9000 In stock

Category: Mx Software

  • Description

Advanced Model Based Films Analysis License for Mx. Measures thickness and topography of transparent optical films >50nm. This license also includes a thick film software license. MBA requires a Nexview Class Optical profiler for data acquisition

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Customer Reviews (5.0 / 5 · 5 reviews)

Matthew I. ★★★★★

I was skeptical about the topography feature at first, but it's incredibly precise for checking uniformity across my samples. The license unlocked everything I needed for optical film analysis without any extra hassle.

Matthew G. ★★★★★

The thickness mapping for films above 50nm is spot-on—I ran a few samples and the topography results matched our reference measurements within a couple nanometers. It’s pricey, but for anyone doing optical film QC, this license pays for itself fast.

Richard ★★★★★

Setup took a bit of fiddling, but once I got the license key entered, the thickness mapping on our sub-100nm films came through crystal clear. The topographical data lines up with our reference samples almost perfectly, which is a huge relief for QC.

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